CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI)
The device is susceptible to electromagnetic fault injection attacks, causing device internal information to be compromised or security mechanisms to be bypassed.
Overview
Electromagnetic fault injection may allow an attacker to locally and dynamically modify the signals (both internal and external) of an integrated circuit. EM-FI attacks consist of producing a local, transient magnetic field near the device, inducing current in the device wires. A typical EMFI setup is made up of a pulse injection circuit that generates a high current transient in an EMI coil, producing an abrupt magnetic pulse which couples to the target producing faults in the device, which can lead to: Bypassing security mechanisms such as secure JTAG or Secure Boot Leaking device information Modifying program flow Perturbing secure hardware modules (e.g. random number generators)